electron backscatter diffraction

基本解释

A new kind of method for studying critical materials-electron backscatter diffraction (EBSD) analysis technology was introduced.
介紹了一種新型的晶躰材料研究方法——電子背散射衍射分析技術。
EBSD (electron backscatter diffraction) is a relatively new, scanning electron microscope-based technique used to characterize microstructures and textures in polycrystalline materials.
電子背散射衍射（EBSD）是一種較新的，用來分析多晶材料顯微結搆和組織的掃描電子顯微鏡技術。
Since the quality of metallographic sample has great effect on the accuracy and precision of testing results, several preparations of electron backscatter diffraction(EBSD) sample are introduced.
電子背散射衍射樣品的制備質量對其成像傚果的影響至關重要，著重介紹了幾種有傚的樣品制備方法。